Characterization of terahertz planar antenna by Josephson admittance spectroscopy

Author

Volkov, Oleg Y. ; Divin, Yuri Y. ; Gubankov, Vladimir N. ; Gundareva, Irina I. ; Pavlovskiy, Valery V.

Author_Institution

Kotelnikov Inst. of Radioengineering & Electron., RAS, Moscow, Russia

fYear

2009

fDate

21-25 Sept. 2009

Firstpage

1

Lastpage

2

Abstract

High-T_c Josephson technology looks very promising for terahertz applications. Here, we report on frequency analysis of broadband THz antenna by Josephson admittance spectroscopy at the frequency range of 50-700 GHz. The [001]-tilt YBa₂Cu₃O_7-x bicrystal junction was used for log-periodic antenna characterization. A frequency-dependent real part of antenna admittance ReY(f) was derived from the measured IV -curves and a log-periodic frequency scaling in ReY(f), corresponding to antenna geometry, was found.

Keywords

barium compounds; broadband antennas; high-temperature superconductors; log periodic antennas; planar antenna arrays; submillimetre wave antennas; superconducting junction devices; yttrium compounds; IV -curves; Josephson admittance spectroscopy; YBa₂Cu₃O_7-x; bicrystal junction; frequency 50 GHz to 700 GHz; frequency analysis; high-T_c Josephson technology; log-periodic antenna characterization; terahertz planar antenna; Admittance measurement; Antenna accessories; Antenna measurements; Broadband antennas; Frequency measurement; Geometry; Log periodic antennas; Planar arrays; Spectroscopy; Submillimeter wave technology;

fLanguage

English

Publisher

ieee

Conference_Titel

Infrared, Millimeter, and Terahertz Waves, 2009. IRMMW-THz 2009. 34th International Conference on

Conference_Location

Busan

Print_ISBN

978-1-4244-5416-7

Electronic_ISBN

978-1-4244-5417-4

Type

conf

DOI

10.1109/ICIMW.2009.5324730

Filename

5324730