Title :
Analysis of a substrate leakage current at MMIC
Author :
Park, Joontae ; Kim, Kihyun ; Cho, Eunil ; Nam, Sangwook
Author_Institution :
Sch. of Electr. Eng., Seoul Nat. Univ., Seoul, South Korea
Abstract :
This paper describes characteristics of a substrate leakage current flowing to the substrate in millimeter wave CMOS IC. The effects of the substrate current are investigated according to operating modes of a power amplifier (PA) - class-A and class-B. Due to the characteristics of V and I at the drain, better performance could be expected in the operation of class-B.
Keywords :
CMOS integrated circuits; MIMIC; leakage currents; power amplifiers; MMIC; V-I characteristics; class-A power amplifier; class-B power amplifier; drain characteristics; millimeter wave CMOS IC; substrate leakage current; Avalanche breakdown; Breakdown voltage; CMOS process; Conductivity; Electric breakdown; Impedance; Leakage current; MMICs; Power generation; Substrates;
Conference_Titel :
Infrared, Millimeter, and Terahertz Waves, 2009. IRMMW-THz 2009. 34th International Conference on
Conference_Location :
Busan
Print_ISBN :
978-1-4244-5416-7
Electronic_ISBN :
978-1-4244-5417-4
DOI :
10.1109/ICIMW.2009.5324736
