• DocumentCode
    2316714
  • Title

    Analysis of a substrate leakage current at MMIC

  • Author

    Park, Joontae ; Kim, Kihyun ; Cho, Eunil ; Nam, Sangwook

  • Author_Institution
    Sch. of Electr. Eng., Seoul Nat. Univ., Seoul, South Korea
  • fYear
    2009
  • fDate
    21-25 Sept. 2009
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    This paper describes characteristics of a substrate leakage current flowing to the substrate in millimeter wave CMOS IC. The effects of the substrate current are investigated according to operating modes of a power amplifier (PA) - class-A and class-B. Due to the characteristics of V and I at the drain, better performance could be expected in the operation of class-B.
  • Keywords
    CMOS integrated circuits; MIMIC; leakage currents; power amplifiers; MMIC; V-I characteristics; class-A power amplifier; class-B power amplifier; drain characteristics; millimeter wave CMOS IC; substrate leakage current; Avalanche breakdown; Breakdown voltage; CMOS process; Conductivity; Electric breakdown; Impedance; Leakage current; MMICs; Power generation; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Infrared, Millimeter, and Terahertz Waves, 2009. IRMMW-THz 2009. 34th International Conference on
  • Conference_Location
    Busan
  • Print_ISBN
    978-1-4244-5416-7
  • Electronic_ISBN
    978-1-4244-5417-4
  • Type

    conf

  • DOI
    10.1109/ICIMW.2009.5324736
  • Filename
    5324736