DocumentCode :
2316939
Title :
Trade-off analysis of fine-grained power gating methods for functional units in a CPU
Author :
Wang, Weihan ; Ohta, Yuya ; Ishii, Yoshifumi ; Usami, Kimiyoshi ; Amano, Hideharu
Author_Institution :
Keio Univ., Yokohama, Japan
fYear :
2012
fDate :
18-20 April 2012
Firstpage :
1
Lastpage :
3
Abstract :
High-speed power gating (PG) techniques are useful for reducing leakage power of functional units in a CPU core. This paper analyzes trade off of functional units in a MIPS R3000 based processor with three fine-grained PG methods: the cell-based, row-based and ring-based. Compared with the cell-based PG technique, which was used in our previous work - Geyser-1 processor, the row-based and ring-based PG technique achieved much smaller area and less implemental cost with a certain additional delay to wake-up latency. The simulation results with benchmark programs show that all three methods can reduce leakage power by 28~54% at 25C.
Keywords :
leakage currents; microprocessor chips; CPU core; Geyser-1 processor; MIPS R3000 based processor; benchmark program; cell-based PG method; cell-based PG technique; fine-grained power gating method; functional unit; leakage power; ring-based PG method; row-based PG method; temperature 25 C; trade-off analysis; wake-up latency; Benchmark testing; Central Processing Unit; Runtime; Standards; Switches; Switching circuits; Transistors; Leakage Power and Processor; Power Gating;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Cool Chips XV (COOL Chips), 2012 IEEE
Conference_Location :
Yokohama
Print_ISBN :
978-1-4673-1201-1
Electronic_ISBN :
978-1-4673-1200-4
Type :
conf
DOI :
10.1109/COOLChips.2012.6216587
Filename :
6216587
Link To Document :
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