DocumentCode :
2317174
Title :
An experimental low temperature DRAM
Author :
Henkels, W.H. ; Lu, N.C.C. ; Hwang, W. ; Rajeevakumar ; Franch, R.L. ; Jenkins, Keith A. ; Bumlot ; Heidel, D.F. ; Immediato
Author_Institution :
IBM Research Division
fYear :
1989
fDate :
25-27 May 1989
Firstpage :
25
Lastpage :
26
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Circuits, 1989. Digest of Technical Papers., 1989 Symposium on
Conference_Location :
Kyoto, Japan
Type :
conf
DOI :
10.1109/VLSIC.1989.1037471
Filename :
1037471
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2317174
