DocumentCode

2317191

Title

Soft-error characteristics in bipolar memory cells with small critical charge

Author

Idei ; Homma, N. ; Nambu, H. ; Sakurai, Y.

Author_Institution

Hitachi Ltd.

fYear

1989

fDate

25-27 May 1989

Firstpage

27

Lastpage

28

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Circuits, 1989. Digest of Technical Papers., 1989 Symposium on

Conference_Location

Kyoto, Japan

Type

conf

DOI

10.1109/VLSIC.1989.1037472

Filename

1037472