DocumentCode :
2317329
Title :
Dependence of partial discharge characteristics at spacer surface on particle size in SF6 gas insulated system
Author :
Hayakawa, Naoki ; Okusu, Takashi ; Nishizawa, Kanako ; Kojima, Hiroki ; Endo, Fumihiro ; Yoshida, Masanobu ; Uchida, Katsumi ; Okubo, Hitoshi
Author_Institution :
Nagoya Univ., Nagoya
fYear :
2008
fDate :
21-24 April 2008
Firstpage :
46
Lastpage :
50
Abstract :
A metallic particle appeared in a gas insulated switchgear (GIS) sometimes adheres on a solid spacer surface. If the adhered metallic particle is exposed to a surge high voltage, a breakdown (BD) may be induced. Therefore, it is eagerly demanded to diagnose its risk correctly under the service voltage by partial discharge (PD) measurement. In this paper, particle-initiated surface PD characteristics were systematically studied in 0.4 MPa SF6 gas by changing the sizes of particles. PD inception voltage (PDIV), temporal change of PD current and the PD pulse number were analyzed in detail. Furthermore, comparing with PD characteristics of particles in a gas gap, the influence of the solid insulator on the PD characteristics was clarified. It was found out that PD characteristics greatly changed with time owing to electric charges deposited on a spacer surface.
Keywords :
SF6 insulation; gas insulated switchgear; partial discharge measurement; particle size; SF6 gas insulated system; electric breakdown; gas insulated switchgear; metallic particle size; partial discharge characteristics; partial discharge measurement; solid spacer surface; surge high voltage; Electrodes; Gas insulation; Geographic Information Systems; Partial discharges; Pulse measurements; Solids; Sulfur hexafluoride; Surface discharges; Surges; Voltage; Diagnosis; GIS; Partial discharges; Particle; SF6 ga;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Condition Monitoring and Diagnosis, 2008. CMD 2008. International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-1621-9
Electronic_ISBN :
978-1-4244-1622-6
Type :
conf
DOI :
10.1109/CMD.2008.4580227
Filename :
4580227
Link To Document :
بازگشت