Title :
Response uniformity improvement of HgCdTe IRFPA
Author :
Kim, Young Ho ; Yang, Keedong ; Park, Jae Hong ; Shin, Myung Sup ; Jung, Han
Author_Institution :
i3Syst., Daejeon, South Korea
Abstract :
Imaging performance of a state-of-the-art infrared focal plane array (IRFPA) is limited by response uniformity of the array. In this work, the relationship between quantum efficiency and epitaxial layer thickness, which affects the response uniformity of FPA, will be studied both experimentally and theoretically.
Keywords :
II-VI semiconductors; cadmium compounds; focal planes; mercury compounds; semiconductor epitaxial layers; HgCdTe; IRFPA response uniformity; epitaxial layer thickness; quantum efficiency; state-of-the-art infrared focal plane array imaging performance; Absorption; Epitaxial layers; Frequency; Infrared imaging; Infrared spectra; Radiative recombination; Size measurement; Substrates; Thickness control; Thickness measurement;
Conference_Titel :
Infrared, Millimeter, and Terahertz Waves, 2009. IRMMW-THz 2009. 34th International Conference on
Conference_Location :
Busan
Print_ISBN :
978-1-4244-5416-7
Electronic_ISBN :
978-1-4244-5417-4
DOI :
10.1109/ICIMW.2009.5324780
