Title :
A design of uncooled thermal image system to block image blurring using an optimum detector warm-shield
Author :
Jeong, Junho ; Youn, Byungyeol
Author_Institution :
Samsung Thales Co., Ltd., Yongin, South Korea
Abstract :
Uncooled TIS is in the spotlight for its small size and low-voltage operation for personal and portable use compare to other TIS. Generally, uncooled TIS using temperature control by TEC converts the gap between TEC temperature and input-image into voltage by ROIC and outputs the analog image. For cooled detector, it is possible to block undesirable infrared input since F number of the optics and the detector are same but for uncooled detector, it is easy to get undesirable infrared input around because the F numbers are different. It becomes more obvious when temperature gap between the equipment and background gets bigger. For TIS, background temperature easily changes inside the system and around the detector because the radiating heat from the electrical circuit inside the system is getting higher as usage time passes, and it makes worse the non-uniformity output characteristics of the detector. In particular, the temperature change of the system itself which depends on its setting position and other temperature-changing factors like electrical circuit inside the system make the additional non-uniformity worse which caused by infrared photon radiates from structures which includes optics and detector. This article would indicate the method of minimizing its image blurring which originates from the F number gap between optics and detector.
Keywords :
image restoration; image sensors; infrared detectors; infrared imaging; readout electronics; temperature control; thermal noise; F number gap; ROIC; background temperature; electrical circuit; heat radiation; image blurring; infrared photon; optimum detector warm-shield; temperature control; thermal noise; uncooled thermal image system design; Circuits; Infrared detectors; Optical detectors; Optical noise; Optical sensors; Optical signal processing; Temperature control; Temperature dependence; Temperature sensors; Thermal resistance;
Conference_Titel :
Infrared, Millimeter, and Terahertz Waves, 2009. IRMMW-THz 2009. 34th International Conference on
Conference_Location :
Busan
Print_ISBN :
978-1-4244-5416-7
Electronic_ISBN :
978-1-4244-5417-4
DOI :
10.1109/ICIMW.2009.5324781