Title :
Localized microwave measurement using AFM-compatible scanning nearfield microwave microscope cantilever with ultra-tall coaxial probe
Author :
Karbassi, A. ; Paulson, C.A. ; Wang, Y. ; Bettermann, A. ; van der Weide, D.W.
Author_Institution :
Univ. of Wisconsin- Madison, Madison
Abstract :
We have demonstrated localized microwave measurements using SNMM cantilevers integrated with ultra-tall coaxial tips. Our results demonstrate improved electromagnetic field confinement with enhanced immunity to the parasitic capacitive coupling that is typically associated with SNMM imaging using cantilever based probes. Dielectric spectroscopy capabilities at microwave frequencies are currently being pursued for material characterization in nanometer scale.
Keywords :
atomic force microscopy; electromagnetic fields; microwave measurement; probes; AFM-compatible scanning near-field microwave microscope cantilever; cantilever based probes; electromagnetic field confinement; localized microwave measurement; microwave frequencies; parasitic capacitive coupling; spectroscopy capabilities; ultratall coaxial probe; Atomic force microscopy; Coaxial components; Dielectric measurements; Electrochemical impedance spectroscopy; Electromagnetic coupling; Electromagnetic fields; Electromagnetic measurements; Microwave imaging; Microwave measurements; Probes;
Conference_Titel :
Antennas and Propagation Society International Symposium, 2007 IEEE
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4244-0877-1
Electronic_ISBN :
978-1-4244-0878-8
DOI :
10.1109/APS.2007.4396251
