DocumentCode :
2317553
Title :
High reliability CMOS SRAM with built-in soft defect detection
Author :
Koo, Chiwan ; Toms, T. ; Jelemensky, J. ; Carter, E. ; Smith, P.
Author_Institution :
Motorola lnc.
fYear :
1989
fDate :
25-27 May 1989
Firstpage :
75
Lastpage :
76
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Circuits, 1989. Digest of Technical Papers., 1989 Symposium on
Conference_Location :
Kyoto, Japan
Type :
conf
DOI :
10.1109/VLSIC.1989.1037496
Filename :
1037496
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2317553
