DocumentCode

2317553

Title

High reliability CMOS SRAM with built-in soft defect detection

Author

Koo, Chiwan ; Toms, T. ; Jelemensky, J. ; Carter, E. ; Smith, P.

Author_Institution

Motorola lnc.

fYear

1989

fDate

25-27 May 1989

Firstpage

75

Lastpage

76

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Circuits, 1989. Digest of Technical Papers., 1989 Symposium on

Conference_Location

Kyoto, Japan

Type

conf

DOI

10.1109/VLSIC.1989.1037496

Filename

1037496