DocumentCode

2317558

Title

A multi bit test trigger circuit for Mbit SRAM´s

Author

Miyaji, F. ; Emort ; Matsuyama, Y. ; Kanaishi, Y. ; Senoh, K. ; Hagiwara, Y.

Author_Institution

SONY Corp.

fYear

1989

fDate

25-27 May 1989

Firstpage

77

Lastpage

78

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Circuits, 1989. Digest of Technical Papers., 1989 Symposium on

Conference_Location

Kyoto, Japan

Type

conf

DOI

10.1109/VLSIC.1989.1037497

Filename

1037497