• DocumentCode
    2317610
  • Title

    Identification of multiple partial discharge sources

  • Author

    Hao, L. ; Lewin, P.L. ; Swingler, S.G.

  • Author_Institution
    Tony Davies High Voltage Lab., Univ. of Southampton, Southampton
  • fYear
    2008
  • fDate
    21-24 April 2008
  • Firstpage
    118
  • Lastpage
    121
  • Abstract
    Partial discharge (PD) measurements are an important tool for assessing the health of power equipment. Different PD may have different effects on the insulation performance of power apparatus. Therefore, identification of PD sources is of great interest to both system utilities and equipment manufacturers. This paper investigates the use of a wide bandwidth PD on-line measurement system which consists of a wide bandwidth sensor, a sophisticated digital signal oscilloscope and a high performance personal computer to facilitate automatic PD source identification. Wavelet analysis was applied to the obtained raw measurement data. The pre-processed data was then processed using correlation analysis. The obtained results have also been processed by accepted approaches, such as phase resolved information. A machine learning technique, namely the support vector machine (SVM) has been used to identify between the different PD sources.
  • Keywords
    condition monitoring; partial discharge measurement; support vector machines; correlation analysis; machine learning technique; multiple partial discharge sources; partial discharge measurements; phase resolved information; support vector machine; Bandwidth; Insulation; Manufacturing; Oscilloscopes; Partial discharge measurement; Partial discharges; Power measurement; Sensor systems; Signal processing; Support vector machines; Partial discharge (PD); on-line condition monitoring; pattern recognition; power transformer; radio frequency current transducer; support vector machine; wavelet analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Condition Monitoring and Diagnosis, 2008. CMD 2008. International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-1621-9
  • Electronic_ISBN
    978-1-4244-1622-6
  • Type

    conf

  • DOI
    10.1109/CMD.2008.4580244
  • Filename
    4580244