Title :
Jitter analysis of high speed sampling systems
Author :
Shinagawa, Mitsuru ; Akazawa, Yukio ; Wakimoto, Tsutomu
Author_Institution :
NTT LSI Laboratories
Conference_Titel :
VLSI Circuits, 1989. Digest of Technical Papers., 1989 Symposium on
Conference_Location :
Kyoto, Japan
DOI :
10.1109/VLSIC.1989.1037506
