Title :
A highly reliable field emission display
Author :
Wang, Wen-Chun ; Tsai, Chun-Hui ; Tsai, Kuang-Lung ; Fran, Yui-Shin ; Sheu, Chai-Yuan ; Hseu, L.K.
Author_Institution :
Electron. Res. & Service Organ., ITRI, Hsinchu, Taiwan
Abstract :
In this paper, a high brightness capability, high luminance efficiency, as well as long life (>5000 hr) of field emission display with very low power consumption is reported. The reliability issue was studied as a function of the pressure inside the FED. By the optimal designs and choices of the cathode, anode, especially construction technology of FED, it was demonstrated that FED could display highly bright images with very low power dissipation and long life.
Keywords :
field emission displays; brightness; field emission display; lifetime; luminance efficiency; power consumption; reliability; Anodes; Artificial intelligence; Cathode ray tubes; Energy consumption; Flat panel displays; Glass; Liquid crystal displays; Optical films; Phosphors; Voltage;
Conference_Titel :
Vacuum Microelectronics Conference, 1998. Eleventh International
Conference_Location :
Asheville, NC, USA
Print_ISBN :
0-7803-5096-0
DOI :
10.1109/IVMC.1998.728627