DocumentCode :
2318140
Title :
Gettering effect inside the glass packaged FED panel
Author :
Kwon, Sang Jik ; Ryu, Kyung Sun ; Cho, Tae Hee ; Lee, Jong Duk
Author_Institution :
Dept. of Electron. Eng., Kyungwon Univ., Kyunggi, South Korea
fYear :
1998
fDate :
19-24 July 1998
Firstpage :
55
Lastpage :
56
Abstract :
High vacuum sealing is one of the most challenging technologies in commercializing FEDs. We have tried to package a Si FEA or a Mo FEA on Si substrate with 0.7inch diagonal by using a soldering method. In this paper, we have evaluated the vacuum level inside the FED panel, which determines the performance of FED, by measuring the emission currents during packaging and comparing it with the calibrated values measured in a test chamber. We evaluate that a getter plays a role of in-situ mini pump during the life of the sealed FED.
Keywords :
calibration; field emission displays; flat panel displays; getters; semiconductor device packaging; soldering; 0.7 in; calibrated values; emission currents; gettering effect; glass packaged FED panel; high vacuum sealing; in-situ mini pump; packaging; soldering method; vacuum level; Cathodes; Current measurement; Electronics packaging; Gettering; Glass; Impurities; Stress; Sun; Testing; Vacuum technology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Microelectronics Conference, 1998. Eleventh International
Conference_Location :
Asheville, NC, USA
Print_ISBN :
0-7803-5096-0
Type :
conf
DOI :
10.1109/IVMC.1998.728636
Filename :
728636
Link To Document :
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