Test education for VLSI systems design engineers

Author

Agrawal, Vishwani D.

Author_Institution

Bell Labs., Lucent Technol., Murray Hill, NJ, USA

fYear

1998

fDate

16-17 Apr 1998

Firstpage

62

Lastpage

64

Abstract

The implementation of entire systems on VLSI chips provides an opportunity for a top-down test strategy. This is possible if the systems designer is familiar with the basic concepts in test, design for testability, and system diagnosis. The paper proposes a two-step education program. The first coarse, “Essentials of Electronic Testing ”, teaches the basic principles of testing. It is an undergraduate-level course and should be included in the core curriculum in addition to a VLSI design course. The second course, “Advanced Concepts in VLSI Testing”, is a graduate-level course. It is useful for VLSI CAD engineers and for researchers

Keywords

VLSI; educational courses; electronic engineering education; integrated circuit testing; VLSI systems design engineers; VLSI testing; electronic testing; graduate-level course; test education; top-down test strategy; two-step education program; undergraduate-level course; Circuit faults; Circuit testing; Design engineering; Design for testability; Electronic equipment testing; Logic testing; System testing; Systems engineering and theory; Systems engineering education; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI '98. System Level Design. Proceedings. IEEE Computer Society Workshop on

Conference_Location

Orlando, FL

Print_ISBN

0-8186-8448-8

Type

conf

DOI

10.1109/IWV.1998.667117

Filename

667117