• DocumentCode
    2318315
  • Title

    Comparison of 1.85mm line reflect line and offset short calibration

  • Author

    Hoffmann, Johannes Paul ; Ruefenacht, Juerg ; Wollensack, Michael ; Zeier, Markus

  • Author_Institution
    METAS Swiss Fed. Office of Metrol., Bern-Wabern, Switzerland
  • fYear
    2010
  • fDate
    Nov. 30 2010-Dec. 3 2010
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    This paper shows how the S-parameters in 1.85 mm coaxial line systems can be defined in a traceable way. It is found that a very fail-proof verification method is to compare two different and independent calibration techniques. Here a line reflect line method is compared to an offset short calibration. Measurements of a load, which were corrected with both calibrations, showed an agreement which was better than 0.003 in linear S-parameters up to 67 GHz. Key factors for achieving this accuracy are the taking into account of connector effects and the setting of pin gaps to defined values with dielectric rings.
  • Keywords
    S-parameters; calibration; coaxial cables; electric connectors; millimetre wave measurement; network analysers; S-parameter; coaxial connector; coaxial line system; dielectric ring; fail-proof verification method; frequency 67 GHz; line reflect line method; offset short calibration; size 1.85 mm; vector network analyzer; Calibration; Calibration Standards; Coaxial Connectors; S-parameters; Vector Network Analyzer;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Measurement Symposium (ARFTG), 2010 76th ARFTG
  • Conference_Location
    Clearwater Beach, FL
  • Print_ISBN
    978-1-4244-7447-9
  • Type

    conf

  • DOI
    10.1109/ARFTG76.2010.5700047
  • Filename
    5700047