Understanding the residual waveguide interface variations on millimeter wave calibration

Author

Lau, Yuenie

Author_Institution

OML, Inc., Morgan Hill, CA, USA

fYear

2010

fDate

Nov. 30 2010-Dec. 3 2010

Firstpage

1

Lastpage

14

Abstract

Calibration is essential in obtaining accurate Vector Network Analyzer (VNA) measurements. Often, it is taken for granted that millimeter wave waveguide calibration is a simple, straightforward process as those in the RF & microwave waveguide calibration or in the coaxial calibration. This paper provides a better understanding of the “residual” or “non-ideal” waveguide aperture interface that often obfuscates a valid, repeatable, Thru-Reft-Line (TRL) and/or Line-Reft-Line (LRL) calibration of a two-port waveguide millimeter wave VNA system. WR05 and WR03 waveguide band data are presented.

Keywords

calibration; millimetre waves; network analysers; waveguides; RF waveguide calibration; VNA measurements; WR03 waveguide band data; WR05 waveguide band data; coaxial calibration; line-reft-line calibration; microwave waveguide calibration; millimeter wave waveguide calibration; nonideal waveguide aperture interface; residual waveguide interface variations; thru-reft-line calibration; two-port waveguide millimeter wave VNA system; vector network analyzer measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Measurement Symposium (ARFTG), 2010 76th ARFTG

Conference_Location

Clearwater Beach, FL

Print_ISBN

978-1-4244-7447-9

Type

conf

DOI

10.1109/ARFTG76.2010.5700066

Filename

5700066