fDate :
Nov. 30 2010-Dec. 3 2010
Abstract :
The following topics are dealt with: millimeter-wave waveguide calibrations and metrology; S-parameter measurements; on-wafer calibrations; linear measurement; through-wafer via modeling; on-wafer and fixtured applications; vector-network-analyzer measurements; millimeter-wave methods; nonlinear measurement; and FET intrinsic I-V characteristics.
Keywords :
S-parameters; calibration; field effect transistors; millimetre wave devices; waveguides; FET intrinsic I-V characteristics; S-parameter measurements; millimeter-wave waveguide calibrations; through-wafer via modeling; vector-network-analyzer measurements;
Conference_Titel :
Microwave Measurement Symposium (ARFTG), 2010 76th ARFTG
Conference_Location :
Clearwater Beach, FL
Print_ISBN :
978-1-4244-7447-9
DOI :
10.1109/ARFTG76.2010.5700070
