DocumentCode
2319020
Title
Study on the retrieval of MODIS 1- km aerosol optical thickness combining extended dark object method and V5.2 algorithm over Beijing
Author
Jiang, Zhe ; Chen, Liangfu ; Su, Lin ; Zhou, Chunyan
Author_Institution
Inst. of Remote Sensing Applic., Chinese Acad. of Sci., Beijing, China
fYear
2009
fDate
20-22 May 2009
Firstpage
1
Lastpage
5
Abstract
Atmospheric aerosol plays a significant role in radiative budget, climate change, hydrological processes, and the global carbon, nitrogen and sulfur cycles. Aerosol optical thickness (AOT) is a key property used in the characterization of atmospheric aerosol. There is a relatively long history of the quantitative estimation of AOT from remotely sensed imagery; especially the dark object method has already made many progresses in the retrieval of AOT over the areas with low surface reflectance. Based on the analysis of the advantages and limits of dark object method, extended dark object method, V5.2 algorithm and four-branched decision method, we introduce a combined method to retrieve AOT over some areas around Beijing using moderate resolution imaging spectroradiometer (MODIS) data, the retrieval results are validated with AERONET data in Beijing and Xianghe sites.
Keywords
aerosols; atmospheric boundary layer; atmospheric chemistry; atmospheric composition; atmospheric optics; atmospheric techniques; carbon; climatology; nitrogen; radiative transfer; remote sensing; sulphur; Beijing; C; China; MODIS data; Moderate Resolution Imaging Spectroradiometer; N; S; aerosol optical thickness; atmospheric aerosol; atmospheric reflection; climate change; dark object method; extended dark object method; four-branched decision method; global carbon; hydrology process; nitrogen cycle; radiative transfer; remote sensed image; sulfur cycle; Aerosols; Algorithm design and analysis; History; Image analysis; Image retrieval; Information retrieval; MODIS; Nitrogen; Optical sensors; Reflectivity; MODIS; V5.2 algorithm; aerosol optical thickness; extended dark object method;
fLanguage
English
Publisher
ieee
Conference_Titel
Urban Remote Sensing Event, 2009 Joint
Conference_Location
Shanghai
Print_ISBN
978-1-4244-3460-2
Electronic_ISBN
978-1-4244-3461-9
Type
conf
DOI
10.1109/URS.2009.5137505
Filename
5137505
Link To Document