DocumentCode :
2319198
Title :
Topographical and tribo-chemical studies of contact sliding on ultra-thin perfluoropolyether film
Author :
Sinha, Sujeet K. ; Choi, Junho ; Kat, Takahisa
Author_Institution :
Dept. of Mech. Eng., Nat. Univ. of Singapore, Singapore
fYear :
2002
fDate :
27-29 Aug. 2002
Abstract :
This paper presents data from topographical (using ellipsometer and optical surface analyzer) and tribo-chemical (using X-ray photoemission spectroscope (XPS)) measurements that were carried out after wear tests on perfluoropolyether (PFPE) films dip-coated on diamond-like-carbon (DLC). The wear experiments were carried out using a glass ball slider sliding on PFPE lubricated (/spl sim/2 nm) magnetic hard disks (having DLC overcoat) under a normal load of 20 mN and at different sliding speeds. The test conditions were maintained such that only the PFPE film was worn and no wear of either the DLC or the magnetic layer of the disk was observed. From the test results we conclude that contact sliding removes the PFPE film causing some chemical compositional changes which might be related to tribo-chemistry of the surface. On the topography, there is a large roughening of the PFPE film due to sliding. This increased roughness of the film is stable even after a rest of several weeks.
Keywords :
X-ray photoelectron spectra; diamond-like carbon; ellipsometry; hard discs; lubrication; polymer films; sliding friction; surface topography; wear; 2 nm; PFPE film; X-ray photoemission spectroscope; chemical compositional changes; contact sliding; diamond-like-carbon; ellipsometer; glass ball slider; lubricated magnetic hard disks; optical surface analyzer; roughening; sliding speeds; tribo-chemical studies; tribo-chemistry; ultra-thin perfluoropolyether film; wear tests; Chemicals; Glass; Hard disks; Magnetic analysis; Magnetic films; Optical films; Photoelectricity; Spectroscopy; Surface topography; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetic Recording Conference, 2002. Digest of the Asia-Pacific
Conference_Location :
Singapore
Print_ISBN :
0-7803-7509-2
Type :
conf
DOI :
10.1109/APMRC.2002.1037642
Filename :
1037642
Link To Document :
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