Title :
Modelling, supervision and diagnosis of a manufacturing cell
Author :
Cárdenas, Clemente ; Olmos, Javier ; Garcia, D. ; Baeyens, Enrique
Author_Institution :
Centro de Autom. Robotica y Tecnologias de la Inf. y de Fabricacion, Parque Tecnologico de Boecillo, Spain
Abstract :
Supervisory control and diagnosis of systems are having more importance in the manufacturing process. There exist several frameworks for synthesis of supervisors and diagnosers for discrete event systems (DES). However, no general methodology applicable for any system and with an implementation orientation is universally accepted. Nevertheless, implementation is extremely important and one of the main goals for research in the future highly automated manufacturing world. In this paper, we propose a benchmark manufacturing cell and some experiences of designing supervisors and diagnosers are carried out using the Ramage and Wonham framework.
Keywords :
cellular manufacturing; discrete event systems; industrial control; manufacturing processes; Ramage framework; Wonham framework; automated manufacturing; benchmark manufacturing cell; diagnosers; discrete event systems; manufacturing cell diagnosis; manufacturing process; modelling; supervisors; supervisory control; Control system synthesis; Control systems; Design methodology; Discrete event systems; Manufacturing automation; Manufacturing processes; Manufacturing systems; Programmable control; Supervisory control; Virtual manufacturing;
Conference_Titel :
Emerging Technologies and Factory Automation, 2003. Proceedings. ETFA '03. IEEE Conference
Print_ISBN :
0-7803-7937-3
DOI :
10.1109/ETFA.2003.1247689