DocumentCode :
2319550
Title :
Remaining lifetime modelling for replacement of power transformer populations
Author :
van Schijndel, A. ; Wetzer, J.M. ; Wouters, P.A.A.F.
Author_Institution :
Eindhoven Univ. of Technol., Arnhem
fYear :
2008
fDate :
21-24 April 2008
Firstpage :
597
Lastpage :
600
Abstract :
The age of the majority of power transformers applied in the western electricity network varies between 25 and 50 years. Depending on the load history and time of operation, replacement on short term is imminent. A technically sound policy concerning the replacement of these assets must be based on knowledge of (i) the life expectancy or reliability of individual components, (ii) how these failure probabilities cumulate to a replacement wave, and (iii) how to manage an expected replacement wave. The population reliability is obtained from individual transformer reliabilities using Arrhenius based modelling of paper insulation degradation. This modelling technique includes measures to cope with inherent uncertainties in available data. Population reliability figures are obtained using an adapted k-out-of-N failure model. The modelling method is applied to existing populations of power transformers in The Netherlands, to evaluate their expected replacement wave.
Keywords :
fault diagnosis; paper; power transformer insulation; reliability; remaining life assessment; expected replacement wave; population reliability; power transformer replacement; remaining lifetime modelling; sound policy; transformer reliabilities; western electricity network; Condition monitoring; Maintenance; Polymers; Power system modeling; Power system reliability; Power transformer insulation; Power transformers; Temperature dependence; Temperature distribution; Uncertainty; Life estimation; Maintenance; Paper insulation; Power system reliability; Power transformer insulation; Power transformers; Reliability modeling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Condition Monitoring and Diagnosis, 2008. CMD 2008. International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-1621-9
Electronic_ISBN :
978-1-4244-1622-6
Type :
conf
DOI :
10.1109/CMD.2008.4580358
Filename :
4580358
Link To Document :
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