DocumentCode :
2319802
Title :
Enhancement of electron emission from silicon tips by nitrogen doped amorphous carbon coating
Author :
Chi, Eung Joon ; Shim, Jae Yeob ; Baik, Hong Koo
Author_Institution :
Dept. of Metall. Eng., Yonsei Univ., Seoul, South Korea
fYear :
1998
fDate :
19-24 July 1998
Firstpage :
210
Lastpage :
211
Abstract :
To enhance the emission current of silicon field emitter, it has been coated with nitrogenated amorphous carbon (a-C:N) by helical resonator plasma enhanced chemical vapor deposition. The a-C:N film is amorphous and hydrogenated with about 30 at% hydrogen. Nitrogen is also included in the amorphous network. Nitrogen in the films reduces the optical band gap resulting in more efficient electron transport. The I-V characteristics show good F-N behavior for silicon and a-C:N coated emitters. a-C:N coating enhances significantly the emission current of silicon tips.
Keywords :
carbon; electron field emission; elemental semiconductors; energy gap; nitrogen; plasma CVD coatings; silicon; Fowler-Nordheim plot; I-V characteristics; Si-C:N; electron emission; electron transport; field emitter; helical resonator plasma enhanced chemical vapor deposition; nitrogen doped amorphous carbon coating; optical band gap; silicon tip; Amorphous materials; Carbon dioxide; Electron emission; Nitrogen; Optical films; Optical resonators; Plasma chemistry; Plasma properties; Plasma transport processes; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Microelectronics Conference, 1998. Eleventh International
Conference_Location :
Asheville, NC, USA
Print_ISBN :
0-7803-5096-0
Type :
conf
DOI :
10.1109/IVMC.1998.728723
Filename :
728723
Link To Document :
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