Title :
Temperature insensitive self-align gated diamond field emitter
Author :
Wisitsora-at, A. ; Kang, W.P. ; Davidson, J.L. ; Li, Q. ; Xu, J.F. ; Kerns, D.V.
Author_Institution :
Dept. of Electr. Eng., Vanderbilt Univ., Nashville, TN, USA
Abstract :
Theoretically, the elimination of semiconductor junctions in vacuum microelectronics device makes them temperature insensitive and thus suitable for high temperature applications. However, conventional techniques using silicon tip has demonstrated temperature insensitive only up to 80/spl deg/C. Since diamond is a wide band gap material, electron emission from diamond emitter is expected to be temperature insensitive over a wider and higher temperature range than electron emission from small band gap semiconductors such as silicon. Emission characteristics of a self-align gated diamond emitter array have been investigated as a function of temperature up to 250/spl deg/C to examine its temperature insensitive behavior.
Keywords :
diamond; electron field emission; elemental semiconductors; high-temperature electronics; vacuum microelectronics; wide band gap semiconductors; 250 C; C; electron emission; high temperature operation; self align gated diamond emitter array; temperature insensitivity; vacuum microelectronics device; wide band gap semiconductor; Application software; Electron emission; Microelectronics; Photonic band gap; Semiconductor materials; Silicon; Temperature distribution; Temperature sensors; Voltage; Wideband;
Conference_Titel :
Vacuum Microelectronics Conference, 1998. Eleventh International
Conference_Location :
Asheville, NC, USA
Print_ISBN :
0-7803-5096-0
DOI :
10.1109/IVMC.1998.728725