DocumentCode :
2319867
Title :
The effect of atmospheric factor on various test gaps under negative impulse voltages
Author :
Chotigo, S. ; Pungsiri, B. ; Kanchana, S.
Author_Institution :
Dept. of Electr. Eng., King Mongkut´´s Univ. of Technol. Thonburi, Bangkok
fYear :
2008
fDate :
21-24 April 2008
Firstpage :
667
Lastpage :
670
Abstract :
This paper dealt with the effect of the atmospheric factors on various test gaps under the standard negative impulse voltage, 1.2/50 mus. The atmospheric factors in this present work were relative humidity, temperature and the ratio of the absolute humidity to the air density correction factor(h/delta). Gaps used were sphere-sphere, rod-plane and rod-rod gaps. The diameter of the sphere was 12.5 cm and the length of the rod was 20 cm. The dimensions of the plane were 4*4 cm2 copper, and 70*70 cm2 steel. The maximum voltage used in this present work was about 230 kV. The results of the breakdown voltage (U50) as a function of atmospheric factors were plotted. All the present data was obtained at the High Voltage Laboratory of King Mongkutpsilas University of Technology Thonburi using a 400 kV 8 kJ impulse voltage generator.
Keywords :
air gaps; electric breakdown; flashover; humidity; pulse generators; High Voltage Laboratory; King Mongkutpsilas University of Technology Thonburi; absolute humidity; air density correction factor; atmospheric factor; breakdown voltage; energy 8 kJ; flashover; impulse voltage generator; negative impulse voltages; relative humidity; temperature; test gaps; voltage 400 kV; Air gaps; Breakdown voltage; Circuit testing; Condition monitoring; Copper; Flashover; Humidity; Impulse testing; Steel; Temperature; Negative Impulse Voltage; flashover; humidity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Condition Monitoring and Diagnosis, 2008. CMD 2008. International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-1621-9
Electronic_ISBN :
978-1-4244-1622-6
Type :
conf
DOI :
10.1109/CMD.2008.4580374
Filename :
4580374
Link To Document :
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