• DocumentCode
    2320044
  • Title

    The influence of ECR MW plasma deposition conditions on the microstructure and morphology of diamond like carbon films

  • Author

    Gulyaev, Yu.V. ; Suzdaltsev, S. Yu ; Sysuev, S.V. ; Yafarov, R.K.

  • Author_Institution
    Inst. of Radio Eng. & Electron., Acad. of Sci., Saratov, Russia
  • fYear
    1998
  • fDate
    19-24 July 1998
  • Firstpage
    238
  • Lastpage
    241
  • Abstract
    This paper is aimed at searching technological conditions for the production of film materials with different allotropic carbon phases and a highly nanhomogeneous surface to lower the field emission voltages of diamond-like carbon films. The investigation results are promising for the development of production methods for low-field-emission to fabricate flat displays, as well as other vacuum microelectronics devices.
  • Keywords
    carbon; crystal microstructure; crystal morphology; plasma CVD coatings; C; ECR MW plasma deposition conditions; allotropic carbon phases; diamond like carbon films; field emission voltages; flat displays; highly nonhomogeneous surface; microstructure; morphology; vacuum microelectronics devices; Carbon dioxide; Diamond-like carbon; Flat panel displays; Microscopy; Microstructure; Plasma temperature; Polymer films; Production; Substrates; Surface morphology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Microelectronics Conference, 1998. Eleventh International
  • Conference_Location
    Asheville, NC, USA
  • Print_ISBN
    0-7803-5096-0
  • Type

    conf

  • DOI
    10.1109/IVMC.1998.728737
  • Filename
    728737