• DocumentCode
    2320137
  • Title

    A novel algorithm of dielectric loss measurement based on orthogonal decomposition

  • Author

    Dapeng, Duan ; Yong, Qian ; Yi, Zeng ; Caixin, Sun ; Xiuchen, Jiang

  • Author_Institution
    Dept. of Electr. Eng., Shanghai Jiao Tong Univ., Shanghai
  • fYear
    2008
  • fDate
    21-24 April 2008
  • Firstpage
    748
  • Lastpage
    751
  • Abstract
    The physical meanings and definition of dielectric loss factor-tandelta was analyzed under the harmonic condition. Voltage and current were defined as vectors in normed linear space. By using the characteristic of orthogonal vector in inner product space, the current signal was decomposed to active and reactive currents. Subsequently, a novel digital algorithm of tandelta measurement, which was defined as ratio of norms of the active current and currents, was presented based on orthogonal decomposition. Lastly, the proposed algorithm was simulated under several conditions. The simulation results show that the proposed algorithm is correct and predominant compared with the harmonic analysis method, and that the algorithm has physical meanings, simple calculation, precise measurement result and strong anti-interference capability.
  • Keywords
    condition monitoring; dielectric loss measurement; insulation testing; leakage currents; vectors; active currents; antiinterference capability; dielectric loss measurement; digital algorithm; harmonic condition; inner product space; insulation condition evaluation; leakage current signal decomposition; normed linear space; orthogonal decomposition; orthogonal vector; precise measurement; reactive currents; tandelta measurement; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Fluctuations; Frequency; Harmonic analysis; Leakage current; Loss measurement; Power supplies; Voltage; Active Current; Active Power; Coefficient; Dielectric Loss Factor; Digital Measurement; Orthogonal Decomposition; Simulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Condition Monitoring and Diagnosis, 2008. CMD 2008. International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-1621-9
  • Electronic_ISBN
    978-1-4244-1622-6
  • Type

    conf

  • DOI
    10.1109/CMD.2008.4580394
  • Filename
    4580394