Title : 
A survey of IGBT fault diagnostic methods for three-phase power inverters
         
        
            Author : 
Lu, Bin ; Sharma, Santosh
         
        
            Author_Institution : 
Innovation Center, Eaton Corp., Milwaukee, WI
         
        
        
        
        
        
            Abstract : 
Fault diagnostics of power converters have drawn increasing attentions due to the widespread adoption of advanced power control devices, such as motor drives and uninterruptible power supplies. This paper presents a literature survey on existing methods for fault diagnosis and protection of IGBTpsilas, with special focus on those used in three-phase power inverters. Eleven methods for open-circuit faults and ten methods for short-circuit faults are evaluated and summarized, based on their performance and implementation efforts. The gate-misfiring faults and their diagnostic methods are also briefly discussed. Finally, based on the survey results, the promising methods are recommended for future work.
         
        
            Keywords : 
condition monitoring; fault diagnosis; insulated gate bipolar transistors; invertors; IGBT fault diagnostic methods; advanced power control devices; condition monitoring; fault diagnostics; gate-misfiring fault diagnostic methods; open-circuit faults; power converters; short-circuit faults; three-phase power inverters; Circuit faults; Condition monitoring; DC generators; Fault detection; Fault diagnosis; Insulated gate bipolar transistors; Inverters; Motor drives; Power system reliability; Voltage; Fault diagnosis; IGBT; condition monitoring; gate-misfiring fault; open-circuit fault; power inverter; short-circuit fault;
         
        
        
        
            Conference_Titel : 
Condition Monitoring and Diagnosis, 2008. CMD 2008. International Conference on
         
        
            Conference_Location : 
Beijing
         
        
            Print_ISBN : 
978-1-4244-1621-9
         
        
            Electronic_ISBN : 
978-1-4244-1622-6
         
        
        
            DOI : 
10.1109/CMD.2008.4580396