DocumentCode
2320388
Title
Comparison of polyamide insulation coatings on metallic substrates using different coating methods
Author
Wang, Huazhong ; Baldwin, Thomas L. ; Zheng, Jim P.
Author_Institution
Dept. of Electr. & Comput. Eng., Florida A&M Univ., Tallahassee, FL, USA
fYear
2004
fDate
19-22 Sept. 2004
Firstpage
576
Lastpage
580
Abstract
In order to find better coating methods for HTS wire, thin layer polyamide coatings were coated on substrate of aluminum foil using different coating methods, including pressured spray, brush, and dip coating techniques. The coating solution was made by polyamide powder dissolved in formic acid. The breakdown strength, dielectric constant, loss, mass density of the coating, and adhesion to the substrate were studied. The effects of substrate, surface properties, temperature and vacuum pressure during the solvent evaporation on the dielectric properties were also studied. It was found that pressured spray coating method was the best among coating techniques; however, the dielectric breakdown strength of the coating was less than that of commercial polyamide film. Dielectric constant and dissipation factor are higher than commercial polyamide film. The optical microscope was used to analyze surface morphology.
Keywords
adhesion; aluminium; dip coating; electric breakdown; evaporation; high-temperature superconductors; insulated wires; insulating coatings; insulating thin films; losses; optical microscopes; permittivity; polymer films; spray coating techniques; surface morphology; Al; HTS; adhesion; aluminum foil; brush coating method; dielectric breakdown strength; dielectric constant; dielectric properties; dip coating techniques; dissipation factor; formic acid; high temperature superconductors wire; losses; mass density; metallic substrates; optical microscope; polyamide film; polyamide insulation coatings; polyamide powder; pressured spray coating methods; solvent evaporation; surface morphology; surface properties; thin layer polyamide coatings; vacuum pressure; Coatings; Dielectric breakdown; Dielectric constant; Dielectric substrates; High temperature superconductors; Insulation; Optical films; Optical microscopy; Spraying; Surface morphology;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation, 2004. Conference Record of the 2004 IEEE International Symposium on
ISSN
1089-084X
Print_ISBN
0-7803-8447-4
Type
conf
DOI
10.1109/ELINSL.2004.1380705
Filename
1380705
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