DocumentCode :
2320814
Title :
In-plan self-organized two-dimensional-ordered GeSi islands grown on Si[001] by molecular beam epitaxy
Author :
Peng, C.S. ; Li, Y.K. ; Zhou, J.M.
Author_Institution :
Inst. of Phys., Acad. Sinica, Beijing, China
fYear :
2002
fDate :
15-20 Sept. 2002
Firstpage :
55
Lastpage :
56
Abstract :
The mechanisms that control the self-assembly of coherent, faceted three-dimensional (3D) islands in lattice-mismatched heteroepitaxial systems have been the subject of recent intense interest. For optical applications random arrangement of uniform-size islands is often adequate; however, for most electronic applications, such as single-electron devices, the islands must be positioned at least in one-dimensional ordering, even two-dimensional ordering is needed. We report a new method to grow in-plan 2-dimensional-ordered GeSi islands on Si [001] substrate by using low-temperature (LT) growth technique. The growth was carried out in a VG V80S MBE system.
Keywords :
Ge-Si alloys; island structure; molecular beam epitaxial growth; self-assembly; semiconductor epitaxial layers; semiconductor growth; GeSi; Si; Si[001]; lattice-mismatched heteroepitaxial systems; molecular beam epitaxy; self-organized two-dimensional-ordered GeSi islands; Atomic force microscopy; Control systems; Germanium silicon alloys; Molecular beam epitaxial growth; Optical buffering; Optical devices; Physics; Self-assembly; Silicon germanium; Single electron devices;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Molecular Beam Epitaxy, 2002 International Conference on
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-7581-5
Type :
conf
DOI :
10.1109/MBE.2002.1037757
Filename :
1037757
Link To Document :
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