• DocumentCode
    2320821
  • Title

    Advances on modelling and characterization of microwave devices at XLIM laboratory

  • Author

    Nallatamby, J.C. ; Obregon, J. ; Nebus, J.M. ; Prigent, M. ; Quere, R.

  • Author_Institution
    Xlim, Univ. de limoges, Limoges
  • fYear
    2008
  • fDate
    24-25 Nov. 2008
  • Firstpage
    3
  • Lastpage
    6
  • Abstract
    During last decade the number of microwave applications augmented in an impressive manner. So, design libraries must include device models more and more versatile. In our presentation we will describe the endeavour undertaken at XLIM laboratory (formerly IRCOM laboratory), in the area of the modelling and characterization of semiconductor microwave devices in order to develop accurate models for the design of modern microwave applications.
  • Keywords
    MMIC; semiconductor device models; XLIM laboratory; design libraries; microwave applications; microwave device characterization; semiconductor microwave device model; Dynamic range; Fluctuations; Laboratories; Low-frequency noise; Microwave devices; Noise generators; Robustness; Sampling methods; Semiconductor device noise; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Integrated Nonlinear Microwave and Millimetre-Wave Circuits, 2008. INMMIC 2008. Workshop on
  • Conference_Location
    Malaga
  • Print_ISBN
    978-1-4244-2645-4
  • Electronic_ISBN
    978-1-4244-2646-1
  • Type

    conf

  • DOI
    10.1109/INMMIC.2008.4745699
  • Filename
    4745699