DocumentCode :
2320821
Title :
Advances on modelling and characterization of microwave devices at XLIM laboratory
Author :
Nallatamby, J.C. ; Obregon, J. ; Nebus, J.M. ; Prigent, M. ; Quere, R.
Author_Institution :
Xlim, Univ. de limoges, Limoges
fYear :
2008
fDate :
24-25 Nov. 2008
Firstpage :
3
Lastpage :
6
Abstract :
During last decade the number of microwave applications augmented in an impressive manner. So, design libraries must include device models more and more versatile. In our presentation we will describe the endeavour undertaken at XLIM laboratory (formerly IRCOM laboratory), in the area of the modelling and characterization of semiconductor microwave devices in order to develop accurate models for the design of modern microwave applications.
Keywords :
MMIC; semiconductor device models; XLIM laboratory; design libraries; microwave applications; microwave device characterization; semiconductor microwave device model; Dynamic range; Fluctuations; Laboratories; Low-frequency noise; Microwave devices; Noise generators; Robustness; Sampling methods; Semiconductor device noise; Time measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Integrated Nonlinear Microwave and Millimetre-Wave Circuits, 2008. INMMIC 2008. Workshop on
Conference_Location :
Malaga
Print_ISBN :
978-1-4244-2645-4
Electronic_ISBN :
978-1-4244-2646-1
Type :
conf
DOI :
10.1109/INMMIC.2008.4745699
Filename :
4745699
Link To Document :
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