An integrated ASIC diagnosis system

Author

Halaviati, Ramin ; Jefferson, Kevin ; Shastry, Nanjunda

Author_Institution

LSI Logic Corp., Milpitas, CA, USA

fYear

1990

fDate

13-16 May 1990

Abstract

The scanning electron microscope design analyzer (LSEM) is an integrated system consisting of a VLSI tester, an electron beam prober, and a modular design automation software. This system provides a user-friendly workstation environment for the complete analysis and debug of complex, submicron ASICs. LSEM has been successfully used to analyze the functional operation and internal timing of many complex designs. The software and hardware integration methods used in the LSEM system to improve VLSI diagnosis are described

Keywords

VLSI; application specific integrated circuits; automatic test equipment; electron beam applications; integrated circuit testing; scanning electron microscope examination of materials; VLSI tester; electron beam prober; integrated ASIC diagnosis system; modular design automation software; scanning electron microscope design analyzer; submicron ASICs; user-friendly workstation environment; Application specific integrated circuits; Automatic testing; Design automation; Electron beams; Scanning electron microscopy; Software testing; System testing; Timing; Very large scale integration; Workstations;

fLanguage

English

Publisher

ieee

Conference_Titel

Custom Integrated Circuits Conference, 1990., Proceedings of the IEEE 1990

Conference_Location

Boston, MA

Type

conf

DOI

10.1109/CICC.1990.124776

Filename

124776