DocumentCode :
2321097
Title :
Size control of self-assembled quantum wires for emission wavelength engineering
Author :
González, L. ; González, Y. ; Granados, D. ; García, J.M. ; Fuster, D. ; Martínez-Pastor, J.
Author_Institution :
CNM-CSIC, Instituto de Microelectron. de Madrid, Spain
fYear :
2002
fDate :
15-20 Sept. 2002
Firstpage :
87
Lastpage :
88
Abstract :
It is now well established (1-5) that nanowires formation along [11~0] takes place when an InAs thin layer (about 2.7 monolayers, ML) is grown by MBE on InP [001] substrate. Strain relaxation is the driving force for the unidirectional observed surface roughening due to the asymmetric accumulated stress induced during MBE growth of a lattice mismatch III-V/III-V\´ heteroepitaxial system. In the case of InAs/InP[001] system, the nanowires covered with an InP cap layer produce photoluminescence (PL) emission at /spl lambda//spl ap/1.5 /spl mu/m at room temperature. However it should be desirable to exactly tune the emission wavelength to the optimum for communication devices (/spl lambda/=1.55 /spl mu/m) as well as to any other wavelength under design. In this work we have grown by MBE samples consisting of In/sub 1-x/Ga/sub x/As and In/sub 1-x/Al/sub x/As (O\n\n\t\t
Keywords :
III-V semiconductors; aluminium compounds; atomic force microscopy; gallium arsenide; indium compounds; molecular beam epitaxial growth; nanowires; photoluminescence; semiconductor growth; semiconductor quantum wires; surface topography; 1.55 micron; 17 to 45 nm; 490 degC; In/sub 1-x/Al/sub x/As; In/sub 1-x/Ga/sub x/As; InP[001] substrate; MBE growth; asymmetric accumulated stress; atomic force microscopy; emission wavelength engineering; photoluminescence; self-assembled quantum wires; size control; strain relaxation; surface roughening; Atomic force microscopy; Atomic measurements; III-V semiconductor materials; Indium phosphide; Nanowires; Size control; Substrates; Surface topography; Temperature; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Molecular Beam Epitaxy, 2002 International Conference on
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-7581-5
Type :
conf
DOI :
10.1109/MBE.2002.1037772
Filename :
1037772
Link To Document :
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