Title :
Thermoelectric properties of the Skutterudite-related phase CoSn 1.5Te1.5
Author :
Nagamoto, Y. ; Tanaka, K. ; Koyanagi, T.
Author_Institution :
Dept. of Electr. & Electron. Eng., Yamaguchi Univ., Ube, Japan
Abstract :
A new skutterudite-related phase CoSn1.5Te1.5 was prepared. This new phase is one of a large family of skutterudites which have shown a good potential for thermoelectric applications. Polycrystalline samples were prepared by the spark plasma sintering method and were characterized by x-ray diffractometry. CoSn1.5Te1.5 has a cubic lattice, space group Im3. With a=9.121 Å. The electrical conductivity, the Seebeck coefficient, and the thermal conductivity were measured over the temperature range 300-900 K. The temperature dependence of the electrical conductivity revealed that CoSn1.5Te1.5 was a semiconductor with a band gap of 0.7 eV. The electrical conductivity increased by doping with Ni. Large Seebeck coefficients up to -450 μV/K were obtained on the n-type undoped samples. The thermal conductivity of CoSn1.5Te1.5 was substantially lower than that of the binary isostructural compounds CoSb3 and IrSb3. The potential of this material for thermoelectric applications is discussed
Keywords :
cobalt alloys; electrical conductivity; energy gap; lattice constants; semiconductor materials; sintering; space groups; tellurium alloys; thermal conductivity; thermoelectric power; tin alloys; 0.7 eV; 300 to 900 K; CoSn1.5Te1.5; Seebeck coefficient; Seebeck coefficients; band gap; cubic lattice; electrical conductivity; semiconductor; skutterudite-related phase; space group Im3; spark plasma sintering method; thermal conductivity; thermoelectric applications; x-ray diffractometry; Plasma applications; Plasma measurements; Plasma temperature; Plasma x-ray sources; Sparks; Tellurium; Temperature dependence; Temperature measurement; Thermal conductivity; Thermoelectricity;
Conference_Titel :
Thermoelectrics, 1997. Proceedings ICT '97. XVI International Conference on
Conference_Location :
Dresden
Print_ISBN :
0-7803-4057-4
DOI :
10.1109/ICT.1997.667146