• DocumentCode
    2321464
  • Title

    Computerized classification of maturity stages of hand bones of children and juveniles

  • Author

    Wastl, S. ; Dickhaus, H.

  • Author_Institution
    Dept. of Med. Inf., Heidelberg Univ., Germany
  • Volume
    3
  • fYear
    1996
  • fDate
    31 Oct-3 Nov 1996
  • Firstpage
    1155
  • Abstract
    Bone age assessment is an important diagnostic task in pediatric radiology. Most of the current methods depend on a subjective rating of bones in hand radiographs, e.g. the TW2 method of Tanner and Whitehouse (1983). Since these approaches are time consuming and characterized by considerable variability an objective and automatic procedure is desirable. The authors´ developed approach depends on a pattern recognition concept. Typical regions of interest (ROIs) of the X-rays, where the growing process of the bones becomes visible, are used as feature matrices. Mainly the spectral representation are correlated with prototypes corresponding to different maturity stages. A set of 280 hand radiographs are used to evaluate the authors´ procedures. 65% to 80% of the bones under consideration are correctly classified. In less than 7% the mis-classification is more than one stage. Further work is done to improve the differentiation of neighbouring stages
  • Keywords
    bone; diagnostic radiography; image classification; image recognition; medical image processing; TW2 method; bone age assessment; bone growing process; feature matrices; hand radiographs; maturity stages; medical diagnostic imaging; misclassification; pattern recognition concept; pediatric radiology; regions of interest; spectral representation; Biology computing; Biomedical computing; Bones; Engineering in Medicine and Biology Society; Image analysis; Pattern analysis; Pediatrics; Prototypes; Radiography; X-rays;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 1996. Bridging Disciplines for Biomedicine. Proceedings of the 18th Annual International Conference of the IEEE
  • Conference_Location
    Amsterdam
  • Print_ISBN
    0-7803-3811-1
  • Type

    conf

  • DOI
    10.1109/IEMBS.1996.652752
  • Filename
    652752