• DocumentCode
    2321481
  • Title

    Very shallow two-dimensional electron gas realized by In/sub x/Al/sub 1-x/As/InAs single quantum well grown on GaAs[111]A substrate

  • Author

    Gozu, Shin-ichiro ; Watanabe, Kotaro ; Ishibashi, Koji ; Aoyagi, Yoshinobu

  • Author_Institution
    CREST Japan Sci. & Technol., Saitama, Japan
  • fYear
    2002
  • fDate
    15-20 Sept. 2002
  • Firstpage
    125
  • Lastpage
    126
  • Abstract
    Summary form only given. Recently, transport properties of quantum dots (QDs), fabricated mainly in Si or GaAs based material, have been extensively studied. InAs is unique material with a large g-factor and a small effective electron mass, and dose not have a surface depletion effect. Until now, two-dimensional electron gas (2DEG) has been realized in AlGaSb/InAs and GaAs/InAs on GaAs [111]A systems. However, the formation of high quality lateral QDs in these system is, in general, not easy with surface metallic gates, because of the poor gate quality in the former and the Fermi level pinning at the highly mismatched interface (GaAs/InAs) in the latter. In this study, we report on the MBE growth of the shallow InAs 2DEG quantum-well structures on GaAs [111]A substrates with InAlAs spacer layers which we expect to overcome the interface problem.
  • Keywords
    Hall effect; III-V semiconductors; aluminium compounds; electron mobility; gallium arsenide; indium compounds; molecular beam epitaxial growth; semiconductor growth; semiconductor quantum wells; two-dimensional electron gas; 2DEG; GaAs; GaAs[111]A substrate; Hall measurement; InAlAs spacer layers; InAlAs-InAs; InAlAs/InAs single quantum well; MBE growth; effective electron mass; electron mobility; g-factor; very shallow two-dimensional electron gas; Capacitive sensors; Chemical technology; Electron mobility; Gallium arsenide; Indium compounds; Laboratories; Materials science and technology; Quantum dots; Substrates; Thickness measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Molecular Beam Epitaxy, 2002 International Conference on
  • Conference_Location
    San Francisco, CA, USA
  • Print_ISBN
    0-7803-7581-5
  • Type

    conf

  • DOI
    10.1109/MBE.2002.1037791
  • Filename
    1037791