DocumentCode
2321481
Title
Very shallow two-dimensional electron gas realized by In/sub x/Al/sub 1-x/As/InAs single quantum well grown on GaAs[111]A substrate
Author
Gozu, Shin-ichiro ; Watanabe, Kotaro ; Ishibashi, Koji ; Aoyagi, Yoshinobu
Author_Institution
CREST Japan Sci. & Technol., Saitama, Japan
fYear
2002
fDate
15-20 Sept. 2002
Firstpage
125
Lastpage
126
Abstract
Summary form only given. Recently, transport properties of quantum dots (QDs), fabricated mainly in Si or GaAs based material, have been extensively studied. InAs is unique material with a large g-factor and a small effective electron mass, and dose not have a surface depletion effect. Until now, two-dimensional electron gas (2DEG) has been realized in AlGaSb/InAs and GaAs/InAs on GaAs [111]A systems. However, the formation of high quality lateral QDs in these system is, in general, not easy with surface metallic gates, because of the poor gate quality in the former and the Fermi level pinning at the highly mismatched interface (GaAs/InAs) in the latter. In this study, we report on the MBE growth of the shallow InAs 2DEG quantum-well structures on GaAs [111]A substrates with InAlAs spacer layers which we expect to overcome the interface problem.
Keywords
Hall effect; III-V semiconductors; aluminium compounds; electron mobility; gallium arsenide; indium compounds; molecular beam epitaxial growth; semiconductor growth; semiconductor quantum wells; two-dimensional electron gas; 2DEG; GaAs; GaAs[111]A substrate; Hall measurement; InAlAs spacer layers; InAlAs-InAs; InAlAs/InAs single quantum well; MBE growth; effective electron mass; electron mobility; g-factor; very shallow two-dimensional electron gas; Capacitive sensors; Chemical technology; Electron mobility; Gallium arsenide; Indium compounds; Laboratories; Materials science and technology; Quantum dots; Substrates; Thickness measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Molecular Beam Epitaxy, 2002 International Conference on
Conference_Location
San Francisco, CA, USA
Print_ISBN
0-7803-7581-5
Type
conf
DOI
10.1109/MBE.2002.1037791
Filename
1037791
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