Title :
Improvement of crystal quality of cubic GaN film using AlN/GaN ordered alloy on GaAs[100] by plasma assisted molecular beam epitaxy
Author :
Kimura, R. ; Shigemori, A. ; Shike, J. ; Ohuchi, M. ; Ishida, K. ; Takahashi, Koichi
Author_Institution :
Dept. of Media Sci., Teikyo Univ. of Sci. & Technol., Yamanashi, Japan
Abstract :
Metastable cubic-GaN (c-GaN) is expected to have many advantages in physical properties over those of the hexagonal phase. Improvement of (AlN)/sub m/(GaN)/sub n/ ordered alloy was achieved by optimizing the nitridation conditions. (m and n represent the number of monolayers in each layer). The ordered alloy is used for uniform effective Al molar content control, which can be achieved by varying the ratio of each layer thickness. This process makes it is easy to maintain high quality stoichiometric growth for extended periods because all constituent layers are binary materials.
Keywords :
III-V semiconductors; aluminium compounds; gallium compounds; molecular beam epitaxial growth; plasma deposition; semiconductor epitaxial layers; semiconductor growth; stoichiometry; Al molar content control; AlGaN; AlN-GaN; AlN/GaN ordered alloy buffer; GaAs; GaAs[100] substrate; GaN; PAMBE; c-GaN; crystal quality; layer thickness; metastable cubic phase; plasma assisted molecular beam epitaxy; stoichiometric growth; Artificial intelligence; Buffer layers; Gallium arsenide; Gallium nitride; Microcomputers; Phase measurement; Plasma sources; Plasma temperature; Substrates; X-ray scattering;
Conference_Titel :
Molecular Beam Epitaxy, 2002 International Conference on
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-7581-5
DOI :
10.1109/MBE.2002.1037798