Title :
Measurement of ion effects on high current relativistic diodes
Author :
Choi, Eun Ha ; Schneider, R.F. ; Uhm, Han S. ; Weidman, D.J. ; Freeman, W.C. ; Cordova ; Moffatt
Author_Institution :
US Naval Surface Warfare Center, Silver Spring, MD, USA
Abstract :
Summary Form only given, as follows. The influence of ion effects on high-current relativistic diodes has been theoretically investigated by E.H. Choi et al. (J. Appl. Phys., vol.61, p.2160, 1987). Experimental observations of ion effects on a relativistic diode have been carried out by the present authors by forming ions in the diode region or by using a preformed plasma in the diode. It was found that the presence of ions in the diode region suppresses the space charge and can significantly enhance the electron current (up to a factor of two). This agrees well with the theoretical results. It was also found that the relativistic electron beam within the diode may be subject to instabilities due to the presence of background ions.<>
Keywords :
ion beam effects; plasma diodes; background ions; electron current; high-current relativistic diodes; instabilities; ion effects; preformed plasma; relativistic electron beam; Diodes; Ion radiation effects; Plasma devices;
Conference_Titel :
Plasma Science, 1989. IEEE Conference Record - Abstracts., 1989 IEEE International Conference on
Conference_Location :
Buffalo, NY, USA
DOI :
10.1109/PLASMA.1989.166078
