DocumentCode :
2322052
Title :
Design and analysis of microstrip line rotman lenses
Author :
Lin, Tse-Yu ; Lee, Seung-Cheol ; Rotman, Ruth ; Green, Yehuda ; Israel, Yaniv ; Lee, Jin-Fa
Author_Institution :
Ohio State Univ., Columbus
fYear :
2007
fDate :
9-15 June 2007
Firstpage :
4425
Lastpage :
4428
Abstract :
We simulate and compare three different Rotman lenses, under the beam excitation from the outermost input port, with the help of FEM method. Preliminary results suggest that for a large lens, eta = 0.65 , with a scan angle of 45deg, the microstrip Rotman lens with the focal ratio suggested by [1], g = (l+alpha2)/2, has a better performance than other designs with smaller focal ratio when uniform amplitude and linear phase variation is desired. Detail investigations will be conducted to compare the pros and cons of each design.
Keywords :
field emission electron microscopy; lenses; microstrip lines; FEM method; Rotman lenses; beam excitation; linear phase variation; microstrip line; uniform amplitude; Delay effects; Electronics industry; Equations; Feeds; Finite element methods; Geometrical optics; Lenses; Microstrip; Optical design; Optical waveguides;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antennas and Propagation Society International Symposium, 2007 IEEE
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4244-0877-1
Electronic_ISBN :
978-1-4244-0878-8
Type :
conf
DOI :
10.1109/APS.2007.4396524
Filename :
4396524
Link To Document :
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