DocumentCode :
2322340
Title :
Regrowth of InAs on the sides of in-situ etched InAs/AlSb superlattices
Author :
Kolasa, Borys ; Savvidis, P. ; Ulrichs, Edzard ; Allen, S. James ; Chow, David ; Daniel, Erik
Author_Institution :
iQUEST, California Univ., Santa Barbara, CA, USA
fYear :
2002
fDate :
15-20 Sept. 2002
Firstpage :
223
Lastpage :
224
Abstract :
We propose to bias uniformly a superlattice by etching mesas of an InAs/AlSb superlattice in-situ and subsequently regrowing InAs on the sidewalls. A uniformly biased semiconductor superlattice produces a Stark ladder which can support gain for frequencies just below the Stark splitting. Since the Stark ladder can be easily tuned with the applied bias, the superlattice can be the basis for a terahertz frequency solid state oscillator. Unfortunately, charge accumulation, electric field instabilities, and electric field domain formation occur in superlattices. "Circuit models" of the domain formation suggest that a thin (4-40 nm) layer of InAs on the sidewall of a /spl sim/1 /spl mu/m wide InAs/AlSb mesa could suppress domain formation without compromising the gain at terahertz frequencies.
Keywords :
III-V semiconductors; Stark effect; aluminium compounds; electric domains; indium compounds; semiconductor superlattices; sputter etching; AlSb layers; InAs terraces; InAs-AlSb; InAs/AlSb mesa; Stark ladder; Stark splitting; applied bias; charge accumulation; chemically assisted ion beam etch; circuit models; electric field domain formation; electric field instabilities; etching; gain; in-situ etched InAs/AlSb superlattices; regrowth; sidewall; terahertz frequency solid state oscillator; uniformly biased semiconductor superlattice; Annealing; Chemicals; Etching; Frequency; Ion beams; Laboratories; Oscillators; Plasma measurements; Semiconductor superlattices; Solid state circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Molecular Beam Epitaxy, 2002 International Conference on
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-7581-5
Type :
conf
DOI :
10.1109/MBE.2002.1037840
Filename :
1037840
Link To Document :
بازگشت