Demonstration of a multilayer meanderline at IR

This paper extends these initial efforts and attempts to increase the transmission and bandwidth by using multiple meanderline layers. A new ellipsometric method of characterization allows spectral measurements from 6-14 mum. The use of multiple layers reduces impedance mismatches at each meanderline layer. Therefore less reflection is seen at each interface. A dielectric superstrate layer is also deposited so that an anti-reflection coating may be used to increase the overall transmittance.