Title :
Demonstration of a multilayer meanderline at IR
Author :
Tharp, Jeffrey S. ; Ginn, James C. ; Lail, Brian A. ; Boreman, Glenn D.
Author_Institution :
Univ. of Central Florida, Orlando
Abstract :
This paper extends these initial efforts and attempts to increase the transmission and bandwidth by using multiple meanderline layers. A new ellipsometric method of characterization allows spectral measurements from 6-14 mum. The use of multiple layers reduces impedance mismatches at each meanderline layer. Therefore less reflection is seen at each interface. A dielectric superstrate layer is also deposited so that an anti-reflection coating may be used to increase the overall transmittance.
Keywords :
dielectric materials; ellipsometry; IR multilayer meanderline; antireflection coating; dielectric superstrate layer; ellipsometric method; impedance mismatch reduction; spectral measurements; Dielectric losses; Dielectric measurements; Fabrication; Geometrical optics; Impedance; Nonhomogeneous media; Optical polarization; Optical retarders; Reflection; Silicon;
Conference_Titel :
Antennas and Propagation Society International Symposium, 2007 IEEE
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4244-0877-1
Electronic_ISBN :
978-1-4244-0878-8
DOI :
10.1109/APS.2007.4396554
