• DocumentCode
    2322714
  • Title

    Java Card Performance Optimization of Secure Transaction Atomicity Based on Increasing the Class Field Locality

  • Author

    Loinig, Johannes ; Steger, Christian ; Weiss, Reinhold ; Haselsteiner, Ernst

  • Author_Institution
    Inst. for Tech. Inf., Graz Univ. of Technol., Graz, Austria
  • fYear
    2009
  • fDate
    8-10 July 2009
  • Firstpage
    342
  • Lastpage
    347
  • Abstract
    Java Cards are embedded systems, very often implemented as smart cards. They are used in banking, e-government, telecommunication, and ticketing. Due to these use cases they have to provide a wide range of security mechanisms and a high performance in relation to the available hardware cost. One of these security features is the transaction mechanism. It ensures that data in persistent memory stays consistent in case of the execution of the application is interrupted unexpectedly by e.g. loss of power. Such transaction mechanisms are very time consuming. Therefore, we propose a caching mechanism for transactions. The mechanism uses a buffer located in RAM and reduces costly write cycles into persistent memory without any loss of security. In order to further increase the performance of this caching mechanism, we additionally introduce a concept to maximize the locality of selected Java fields which are written very often.
  • Keywords
    Java; cache storage; embedded systems; persistent objects; security of data; smart cards; transaction processing; Java card performance optimization; Java fields; RAM; buffer; caching mechanism; class field locality; embedded systems; persistent memory; secure transaction atomicity; security mechanisms; smart cards; transaction mechanism; Banking; Data security; Electronic government; Embedded system; Hardware; Java; Optimization; Power system security; Random access memory; Smart cards; Anti-Tearing; Java Annotations; Java Card; Transaction Mechanism;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Secure Software Integration and Reliability Improvement, 2009. SSIRI 2009. Third IEEE International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-0-7695-3758-0
  • Type

    conf

  • DOI
    10.1109/SSIRI.2009.39
  • Filename
    5325352