Title :
UVeriESD: An ESD verification tool for SoC design
Author :
Hsueh, K. Kelvin ; Ke, Sin-Hao ; Lee, Jeffrey ; Rosenbaum, Elyse
Author_Institution :
United Microelectron. Corp., Sunnyvale, CA
fDate :
Nov. 30 2008-Dec. 3 2008
Abstract :
This paper describes an ESD verification methodology that is applied at several points in the design process. By identifying ESD reliability hazards at each step in the design flow, the amount of redesign needed to address ESD reliability issues is greatly reduced. The checker efficiently computes power bus parasitic resistances, allowing it to be used during floor planning when the library is unavailable; it finds the three shortest ESD paths between any two external pads, allowing the checker to be used during IO ring placement before completion of the chip layout; it processes the GDS file and checks the voltage drop between any two ESD devices; it simulates the voltage drop across each ESD device in the discharge path in order to detect ESD design flaws. The ESD checker can be used with or without the actual extracted netlist, i.e., with either a DSPF or a DEF file.
Keywords :
electrostatic discharge; integrated circuit layout; integrated circuit reliability; logic design; system-on-chip; ESD checker; ESD design flaws; ESD reliability hazards; ESD verification tool; GDS file; IO ring placement; SoC design; UVeriESD; chip layout; electrostatic discharge; floor planning; power bus parasitic resistances; system-on-chip; voltage drop; Circuit simulation; Computational modeling; Data mining; Electrostatic discharge; Hazards; Kelvin; Microelectronics; Path planning; Process design; Voltage;
Conference_Titel :
Circuits and Systems, 2008. APCCAS 2008. IEEE Asia Pacific Conference on
Conference_Location :
Macao
Print_ISBN :
978-1-4244-2341-5
Electronic_ISBN :
978-1-4244-2342-2
DOI :
10.1109/APCCAS.2008.4745958