DocumentCode
2322805
Title
Influence of thin GaAs and AlAs cap layers on the structural properties of InAs quantum dots grown by molecular beam epitaxy
Author
Ferdos, Fariba ; Wang, Shumin ; Wei, Yongqiang ; Larsson, Anders ; Sadeghi, Mahdad ; Zhao, Qingxiang
Author_Institution
Dept. of Microelectron., Chalmers Univ. of Technol., Goteborg, Sweden
fYear
2002
fDate
15-20 Sept. 2002
Firstpage
285
Lastpage
286
Abstract
Self-organised InAs quantum dots (QDs) are used as optical gain material in long wavelength lasers on GaAs. The measured QD height and density are often used as figures of merits, and great efforts have been made to maximise these two parameters to extend the wavelength coverage. In this work, we investigate the influence of initial GaAs and AlAs cap layers on the structural properties of InAs QDs. The study clearly shows that capping of InAs QDs causes a strong modification of not only the QD shape and height but also the QD density.
Keywords
III-V semiconductors; aluminium compounds; atomic force microscopy; gallium arsenide; indium compounds; molecular beam epitaxial growth; semiconductor growth; semiconductor quantum dots; 510 C; AlAs; GaAs; InAs; InAs quantum dots; molecular beam epitaxy; structural properties; thin AlAs cap layers influence; thin GaAs cap layers influence; Atomic force microscopy; Gallium arsenide; Molecular beam epitaxial growth; Multilevel systems; Optical surface waves; Quantum dot lasers; Quantum dots; Surface morphology; US Department of Transportation; Wavelength measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Molecular Beam Epitaxy, 2002 International Conference on
Conference_Location
San Francisco, CA, USA
Print_ISBN
0-7803-7581-5
Type
conf
DOI
10.1109/MBE.2002.1037871
Filename
1037871
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