Title :
Low-temperature growth of self-assembled InAs dots on GaAs by MBE
Author :
Zhan, H.H. ; Nötzel, R. ; Hamhuis, G.J. ; Eijkemans, T.J. ; Wolter, J.H.
Author_Institution :
COBRA Inter-Univ. Res. Inst., Eindhoven Univ. of Technol., Netherlands
Abstract :
Low-temperature (LT) MBE grown GaAs is of great interest due to its unique semiinsulating and ultrafast carrier recombination properties associated with the excess As incorporation during growth. Compared to bulk material and quantum wells we expect that the enhanced optical nonlinearity of quantum dots combined with the ultrafast optical response provided by LT growth will be useful for applications as ultrafast optical modulators and switches operating at low power. The main obstacle imposed for quantum dot formation at low temperature, however, is the small adatom migration length. Here we study the possibility of self-assembled InAs dot formation at low growth temperature on GaAs [100] and [311]A substrates and the extend to which strain effects and optimized growth conditions can outweigh the small adatom migration length for quantum dot formation.
Keywords :
III-V semiconductors; X-ray diffraction; adsorption; carrier lifetime; indium compounds; molecular beam epitaxial growth; nonlinear optics; optical modulation; optical switches; semiconductor growth; semiconductor quantum dots; GaAs; GaAs substrates; InAs; adatom migration length; excess As incorporation; low-temperature growth; low-temperature molecular beam epitaxial grown GaAs; optical nonlinearity; quantum dot formation; self-assembled InAs dot formation; semiinsulating properties; ultrafast carrier recombination properties; ultrafast optical modulators; ultrafast optical response; ultrafast optical switches; Capacitive sensors; Gallium arsenide; Optical buffering; Optical modulation; Quantum dots; Substrates; Temperature; US Department of Transportation; Ultrafast optics; X-ray scattering;
Conference_Titel :
Molecular Beam Epitaxy, 2002 International Conference on
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-7581-5
DOI :
10.1109/MBE.2002.1037884