Title :
The effect of substrate growth temperature on the optical properties of self-assembled InAs quantum dots
Author :
Plant, J. ; Zhang, B. ; Santori, C. ; Solomon, G. ; Yamamoto, Y.
Author_Institution :
Edward L. Ginzton Lab., Stanford Univ., CA, USA
Abstract :
Summary form only given. We investigate MBE-grown samples of capped InAs quantum dots with substrate growth temperatures ranging from 465/spl deg/C to 515/spl deg/C and explore their optical properties. In our first measurement, we perform low temperature (5K) photoluminescence experiments on ensembles of quantum dots in our samples using 100 /spl mu/w of continuous-wave, 735 nm light from a Ti-sapphire laser for exciting the quantum dots. We find that the photoluminescence emission energy decreases with increasing substrate growth temperature. Our second type of optical experiment involves the time resolution of the optical emission from a pulsed laser source. We retrieve time-resolved data using a Hamamatsu streak-camera with attached monochrometer. Our streakcamera measurements yield color-hue plots of intensity versus wavelength versus time. This allows us to tell not only where in the energy spectrum our quantum dots are emitting, but also for how long they emit. We find that increasing the growth temperature decreases the quantum dot lifetime.
Keywords :
III-V semiconductors; colour; molecular beam epitaxial growth; photoluminescence; radiative lifetimes; self-assembly; semiconductor quantum dots; spectral line intensity; time resolved spectra; 465 to 515 degC; 5 K; 735 nm; Hamamatsu streak-camera; InAs; MBE; PL emission energy; color-hue plots; optical properties; photoluminescence; quantum dot lifetime; self-assembled InAs quantum dots; substrate growth temperature; time resolved optical emission; Energy resolution; Information retrieval; Optical pulses; Performance evaluation; Photoluminescence; Quantum dot lasers; Quantum dots; Stimulated emission; Temperature distribution; Time measurement;
Conference_Titel :
Molecular Beam Epitaxy, 2002 International Conference on
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-7581-5
DOI :
10.1109/MBE.2002.1037914