Title :
SAR ADC algorithm with redundancy
Author :
Ogawa, Tomohiko ; Kobayashi, Haruo ; Hotta, Masao ; Takahashi, Yosuke ; San, Hao ; Takai, Nobukazu
Author_Institution :
Dept. of Electron. Eng., Gunma Univ., Maebashi
fDate :
Nov. 30 2008-Dec. 3 2008
Abstract :
This paper describes a redundant algorithm for a highly reliable Successive Approximation Register (SAR) ADC where mistakes of comparator decision can be digitally-corrected. We generalize a conventional non-binary search algorithm which requires more conversion steps in the SAR ADC than the binary search algorithm, and clarify which decision errors can be digitally-corrected with the derived redundant algorithm. We also shows that the sampling speed of the SAR ADC using the proposed algorithm can be faster when the incomplete settling effects of the DAC inside the SAR ADC are taken into account.
Keywords :
analogue-digital conversion; digital-analogue conversion; ADC algorithm; DAC; comparator decision; redundant algorithm; successive approximation register; Approximation algorithms; Automotive electronics; Costs; Design methodology; Error correction; Microcontrollers; Redundancy; Reliability engineering; Sampling methods; Voltage; Digital Error Correction; Non-binary; Redundancy; SAR ADC;
Conference_Titel :
Circuits and Systems, 2008. APCCAS 2008. IEEE Asia Pacific Conference on
Conference_Location :
Macao
Print_ISBN :
978-1-4244-2341-5
Electronic_ISBN :
978-1-4244-2342-2
DOI :
10.1109/APCCAS.2008.4746011