DocumentCode
2323807
Title
One model of profile function for X-ray scattering in thin films
Author
Trepkov, R.V.
Author_Institution
Dept. of Comput. Phys., St. Petersburg Univ.
fYear
2001
fDate
2001
Firstpage
267
Lastpage
271
Abstract
The study of crystalline thin films is of great interest. The characteristics of thin films are found in experiments on high intensity X-ray diffraction. These X-rays beams are produced by modern synchrotrons. It is usually assumed that the ordered part of the crystalline structure in a thin film is described by a profile function y(z), here z is the variable perpendicular to the film
Keywords
X-ray crystallography; thin films; X-ray scattering; X-rays beams; crystalline structure; high intensity X-ray diffraction; profile function model; synchrotrons; thin films; Crystallization; Eigenvalues and eigenfunctions; Equations; Fourier transforms; Inverse problems; Physics computing; Synchrotrons; Transistors; X-ray diffraction; X-ray scattering;
fLanguage
English
Publisher
ieee
Conference_Titel
Day on Diffraction 2001. Proceedings. International Seminar
Conference_Location
St.Petersburg
Print_ISBN
5-7997-0366-9
Type
conf
DOI
10.1109/DD.2001.988484
Filename
988484
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