• DocumentCode
    2323850
  • Title

    MBE growth and properties of GaCrN

  • Author

    Hashimoto, M. ; Zhou, Y.K. ; Kanamura, M. ; Katayama-Yoshida, H. ; Asahi, H.

  • Author_Institution
    Inst. of Sci. & Ind. Res., Osaka Univ., Ibaraki, Japan
  • fYear
    2002
  • fDate
    15-20 Sept. 2002
  • Firstpage
    415
  • Lastpage
    416
  • Abstract
    Since the discovery of the carrier-induced ferromagnetism in InMnAs and GaMnAs, diluted magnetic semiconductors (DMSs) have been of much interest from an industrial viewpoint because of their potential utility for so-called "spin-electronics". However, the highest Curie temperature reported so far for III-V-based DMSs was 110 K for GaMnAs, being far from room temperature. Recently, theoretical studies revealed the possibility of DMSs that exhibit ferromagnetism at room temperature and predicted that GaN-based DMSs, especially Cr-doped GaN, are possible candidates for those materials. We report the successful growth of a new III-V-based DMS GaCrN and their magnetic and optical properties.
  • Keywords
    Curie temperature; X-ray diffraction; chromium compounds; ferromagnetic materials; gallium compounds; magnetic epitaxial layers; magnetic semiconductors; magnetisation; molecular beam epitaxial growth; photoluminescence; semiconductor growth; 110 K; Al/sub 2/O/sub 3/; Curie temperature; GaCrN; GaCrN epitaxial layers; X-ray diffraction measurements; X-ray diffraction rocking curve; carrier-induced ferromagnetism; diluted magnetic semiconductors; magnetic properties; magnetization; molecular beam epitaxial growth; optical properties; photoluminescence spectra; sapphire (0001) substrates; spin-electronics; superconducting quantum interference device magnetometer; Magnetic fields; Magnetic properties; Molecular beam epitaxial growth; Photoluminescence; Plasma measurements; Plasma temperature; Saturation magnetization; Superconducting magnets; X-ray diffraction; X-ray scattering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Molecular Beam Epitaxy, 2002 International Conference on
  • Conference_Location
    San Francisco, CA, USA
  • Print_ISBN
    0-7803-7581-5
  • Type

    conf

  • DOI
    10.1109/MBE.2002.1037935
  • Filename
    1037935